发明名称 Semiconductor memory device having full depletion type logic transistors and partial depletion type memory transistors
摘要 A semiconductor device includes a semiconductor substrate, an insulating layer, a silicon layer, full depletion type transistors, and partial depletion type transistors. The insulating layer is formed on the Semiconductor substrate. The silicon layer has a first region and a second region. The silicon layer is formed on the insulating layer. The full depletion type transistors are used for a logical circuit, and are formed on the silicon layer at the first region. The partial depletion type transistors are used for a memory cell circuit and are formed on the silicon layer at he second region. The second region of the silicon layer is maintained at a fixed potential.
申请公布号 US7507610(B2) 申请公布日期 2009.03.24
申请号 US20050271980 申请日期 2005.11.14
申请人 发明人
分类号 H01L21/00;H01L21/84 主分类号 H01L21/00
代理机构 代理人
主权项
地址