发明名称 |
PLASMA PROCESSING APPARATUS AND PLASM PROCESSING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a plasma processing apparatus and a plasma processing method capable of suppressing an increase in temperature when cutting a workpiece. SOLUTION: The plasma processing apparatus comprises: a first slice electrode 4 for cutting a silicon ingot 100 as a workpiece; a second slice electrode 6 that is arranged with an interval horizontally to the first slice electrode 4 and cuts the silicon ingot 100; and a voltage application section 8 for generating a prescribed potential difference between the first slice electrode 4 and the second slice electrode 6 so that plasma for cutting the silicon ingot 100 is generated when the first slice electrode 4 and the second slice electrode 6 are arranged so that they oppose the cutting direction of the silicon ingot 100 to the silicon ingot 100. COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009054777(A) |
申请公布日期 |
2009.03.12 |
申请号 |
JP20070219842 |
申请日期 |
2007.08.27 |
申请人 |
TOYO ADVANCED TECHNOLOGIES CO LTD;NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
ABE YOSHINORI;YAMAGUCHI MITSUTAKA;MASUDA ATSUSHI;KONDO MICHIO |
分类号 |
H01L21/3065 |
主分类号 |
H01L21/3065 |
代理机构 |
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地址 |
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