发明名称 Phase-change memory device and method that maintains the resistance of a phase-change material in a set state within a constant resistance range
摘要 Provided are a phase-change memory device and method that maintains a resistance of a phase-change material in a set state within a constant resistance range. In the method, data is provided to a first phase-change memory cell and then it is first determined whether data stored in the first phase-change memory cell and the data provided to the first phase-change memory cell are identical. If the data stored in the first phase-change memory cell and the data provided to the first phase-change memory cell are not identical, a complementary write current is provided to the first phase-change memory cell and it is second determined whether the data stored in the first phase-change memory cell and the data provided to the first phase-change memory cell are identical. If the data stored in the first phase-change memory cell and the data provided to the first phase-change memory cell are identical, data is provided to a second phase-change memory cell.
申请公布号 US7499306(B2) 申请公布日期 2009.03.03
申请号 US20070772569 申请日期 2007.07.02
申请人 发明人
分类号 G11C11/00 主分类号 G11C11/00
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