| 摘要 |
The crystalline molecular sieve material EMM-7 has, in its as-synthesized form, an X-ray diffraction pattern including d-spacing maxima substantially as set forth in Table 1: <tables id="TABLE-US-00001" num="00001"> <table frame="none" colsep="0" rowsep="0"> <tgroup align="left" colsep="0" rowsep="0" cols="3"> <colspec colname="offset" colwidth="21pt" align="left"/> <colspec colname="1" colwidth="77pt" align="center"/> <colspec colname="2" colwidth="119pt" align="center"/> <thead> <row> <entry/> <entry namest="offset" nameend="2" rowsep="1">TABLE 1</entry> </row> <row> <entry/> <entry namest="offset" nameend="2" align="center" rowsep="1"/> </row> <row> <entry/> <entry>Interplanar d-Spacing (Å)</entry> <entry>Relative Intensity, I/Io x 100</entry> </row> <row> <entry/> <entry namest="offset" nameend="2" align="center" rowsep="1"/> </row> </thead> <tbody valign="top"> <row> <entry/> <entry>8.40 ± 0.2</entry> <entry>w-m</entry> </row> <row> <entry/> <entry>6.80 ± 0.2</entry> <entry>w-s</entry> </row> <row> <entry/> <entry>4.46 ± 0.1</entry> <entry>m-s</entry> </row> <row> <entry/> <entry>3.73 ± 0.1</entry> <entry>m-s</entry> </row> <row> <entry/> <entry>3.68 ± 0.1</entry> <entry>m-s</entry> </row> <row> <entry/> <entry>3.40 ± 0.1</entry> <entry> s-vs</entry> </row> <row> <entry/> <entry namest="offset" nameend="2" align="center" rowsep="1"/> </row> </tbody> </tgroup> </table> </tables> wherein "vs" means very strong (greater than 60 to 100), "s" means strong (greater than 40 to 60), "m" means medium (greater than 20 to 40) and "w" means weak (0 to 20).
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