发明名称 Method of manufacture of a trench-gate semiconductor device
摘要 A method of making a trench MOSFET includes forming a layer of porous silicon (26) at the bottom of a trench and then oxidizing the layer of porous silicon (26) to form a plug (30) at the bottom of the trench. This forms a thick oxide plug at the bottom of the trench thereby reducing capacitance between gate and drain.
申请公布号 US7485534(B2) 申请公布日期 2009.02.03
申请号 US20050538217 申请日期 2005.06.09
申请人 NXP B.V. 发明人 HIJZEN ERWIN A.
分类号 H01L21/336;H01L29/423;H01L29/78 主分类号 H01L21/336
代理机构 代理人
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