发明名称 Optical waveform measurement apparatus and optical waveform measurement method
摘要 <p>A first polarization controller (2) controls a polarization state of measured light. A second polarization controller (3) controls a polarization state of an optical sampling pulse. The measured light and the optical sampling pulse having the polarization states controlled are input to an optical fiber (23) . An optical signal output from the optical fiber (23) is transmitted to a polarizer (24). A first control unit (46) adjusts the first polarization controller (2) based on the measured light output from the optical fiber (23) and the measured light output from the polarizer (24). A second control unit (34) adjusts the second polarization controller (3) based on an optical sampling pulse output from the optical fiber (23). Waveform measurement is performed by using the output of the polarizer (24).</p>
申请公布号 EP1833181(B1) 申请公布日期 2008.12.17
申请号 EP20060013475 申请日期 2006.06.29
申请人 FUJITSU LTD. 发明人 FUTAMI, FUMIO;WATANABE, SHIGEKI;ONO, SHUNSUKE;OKABE, RYOU
分类号 G01J11/00;G02F1/39 主分类号 G01J11/00
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