发明名称 |
On die thermal sensor of semiconductor memory device and method thereof |
摘要 |
An on die thermal sensor (ODTS) includes a thermal sensor for outputting a first comparing voltage by detecting a temperature of the semiconductor memory device; a comparing unit for outputting a trimming code by comparing the first comparing voltage with a second comparing voltage and increasing or decreasing a preset digital code in response to the comparing result; and a voltage level adjusting unit for adjusting a voltage level of the second comparing voltage by determining a maximum variation voltage and a minimum variation voltage based on the trimming code and a temperature control code.
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申请公布号 |
US7451053(B2) |
申请公布日期 |
2008.11.11 |
申请号 |
US20060527849 |
申请日期 |
2006.09.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JEONG CHUN-SEOK |
分类号 |
G01K15/00;G01K7/01;G01K13/00;G01R31/26;G06F19/00;G11C11/406;H01L21/8242;H01L27/108 |
主分类号 |
G01K15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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