发明名称 METHOD OF MANUFACTURING SILICON NITRIDE FILM, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 A method of manufacturing a silicon nitride film that forms a silicon nitride film on a surface of a substrate comprises sequentially repeating first through third steps. The first step includes feeding a first gas containing silicon and nitrogen to the surface of the substrate. The second step includes feeding a second gas containing nitrogen to the surface of the substrate. The third step includes feeding a third gas containing hydrogen to the surface of the substrate.
申请公布号 US2008274605(A1) 申请公布日期 2008.11.06
申请号 US20080167025 申请日期 2008.07.02
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES, INC.;TOKYO ELECTRON LIMITED 发明人 HOSHI TAKESHI;SAITO TSUYOSHI;KATO HITOSHI;ORITO KOICHI
分类号 H01L21/31;H01L21/28 主分类号 H01L21/31
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