Subwavelength resolution optical microscopy

摘要

Provided herein are methods for imaging subwavelength structures in three dimensions and with high resolution. The methods comprise illuminating subwavelength structures with an illuminating wavelength of light and detecting the self-image generated thereby at a distance distal to the structures. Also provided is a method for confining propagating light to a sub-diffraction limit dimension by illuminating a surface of a metal structure with subwavelength features with a wavelength of coherent light such that light propagating from the features is confined to a dimension that is a sub-diffraction limit thereof.