发明名称 METHOD AND STRUCTURE FOR LOW CAPACITANCE ESD ROBUST DIODES
摘要 A diode having a capacitance below 0.1 pF and a breakdown voltage of at least 500V. The diode has an anode of a first conductivity type and a cathode of a second conductivity type disposed below the anode. At least one of the cathode and anode have multiple, vertically abutting diffusion regions. The cathode and anode are disposed between and bounded by adjacent isolation regions.
申请公布号 US2008251846(A1) 申请公布日期 2008.10.16
申请号 US20080118875 申请日期 2008.05.12
申请人 VOLDMAN STEVEN H 发明人 VOLDMAN STEVEN H.
分类号 H01L21/76;H01L23/62;H01L21/329;H01L21/62;H01L21/822;H01L27/02;H01L27/04;H01L29/861 主分类号 H01L21/76
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