发明名称 SYSTEM TESTING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To solve the problem of a conventional system testing apparatus wherein, when a faulty module has been adjusted, replaced or repaired to remove a fault, the fact that the fault has been removed is not taken into account at all, resulting in low accuracy with which priority is determined next time and a difference with the priority with which faults must be actually dealt with. <P>SOLUTION: A system testing apparatus is provided which, when a faulty module has turned into a conforming module as a result of adjustments, replacement or repair, can increase the accuracy of determining the priority of the next module to be adjusted, etc., by updating the assumed rate of failure of other modules. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008203955(A) 申请公布日期 2008.09.04
申请号 JP20070036332 申请日期 2007.02.16
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 YOSHIDA TERUHISA
分类号 G06F11/22;G01R31/00 主分类号 G06F11/22
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