发明名称 Method for fabricating controlled stress silicon nitride films
摘要 A method for fabricating a multiple layer silicon nitride film on a semiconductor substrate is provided herein. In one embodiment, a method for fabricating a multiple layer silicon nitride film on a semiconductor substrate includes providing a substrate over which the multiple layer silicon nitride film is to be formed; and forming the multiple layer silicon nitride film in a single processing reactor by: (a) depositing a base layer comprising silicon nitride on the base structure; (b) depositing a middle layer comprising a stress-controlling material on the base layer; and (c) depositing a top layer comprising silicon nitride on the middle layer. The stress-controlling material selectively increases or reduces the stress of the multiple layer silicon nitride film as compared to silicon nitride alone.
申请公布号 US7416995(B2) 申请公布日期 2008.08.26
申请号 US20050273381 申请日期 2005.11.12
申请人 APPLIED MATERIALS, INC. 发明人 IYER R. SURYANARAYANAN;TANDON SANJEEV;SMITH JACOB W.
分类号 H01L21/31 主分类号 H01L21/31
代理机构 代理人
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