发明名称 ASSEMBLY FOR CONTROLLING UNIFORMITY OF PROBE CARD AND APPARATUS FOR INSPECTING ELECTRIC CONDITION HAVING THE SAME, AND METHOD FOR CONTROLLING UNIFORMITY USING THE SAME
摘要 A flatness adjusting assembly, an electrical inspection device, and a flatness adjusting method are provided to easily adjust a flatness of a substrate, which is contacted with a DUT, by controlling a non-elastic coupling between the substrate and the DUT. A flatness adjusting assembly for an electrical inspection device includes a coupling unit(20) and an adjusting unit(22). The coupling unit couples first and second substrates(10,12) with each other. The first substrate has a first surface, which is contacted with a DUT(Device Under Test). The second substrate is arranged to face a second surface of the first substrate, which is opposed to the first substrate. The adjusting unit is elastically coupled with the coupling unit and adjusts a flatness of the first substrate by adjusting the non-elastic coupling between the adjusting unit and the first substrate.
申请公布号 KR20080075607(A) 申请公布日期 2008.08.19
申请号 KR20070014714 申请日期 2007.02.13
申请人 PHICOM CORP. 发明人 HWANG, JUN TAE;KIM, BAE HWAN
分类号 G01R31/26;G01R1/06 主分类号 G01R31/26
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