发明名称 |
Measurement Arrangement for Determining the Characteristic line Parameters by Measuring Scattering Parameters |
摘要 |
The present invention relates to a measurement arrangement for determining the characteristic line parameters by measuring the S-parameters as a function of the frequency of an electrical signal line that achieves an increased measurement bandwidth, namely a measurement bandwidth >4 GHz. To achieve this the electrical signal line under test has several neighboring signal lines which are connected to ground on one side and left open on the opposite side in an alternating manner.
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申请公布号 |
US2008136423(A1) |
申请公布日期 |
2008.06.12 |
申请号 |
US20060567339 |
申请日期 |
2006.12.06 |
申请人 |
LUDWIG THOMAS;SCHETTLER HELMUT;WINKEL THOMAS-MICHAEL |
发明人 |
LUDWIG THOMAS;SCHETTLER HELMUT;WINKEL THOMAS-MICHAEL |
分类号 |
G01R27/00 |
主分类号 |
G01R27/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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