发明名称 METHOD OF MANUFACTURING AN INSULATED GATE FIELD EFFECT TRANSISTOR
摘要 <p>A method for fabricating an insulated gate field effect transistor (20) comprising an gate dielectric layer (24) between a gate electrode (23) and a semiconductor substrate (21), wherein the gate electrode (24) is at least partially disposed within a recess (22) formed within the substrate (21), the 5 recess (22) extending between a source region (25) and a drain region (26) of the transistor (20).</p>
申请公布号 WO2008065616(A1) 申请公布日期 2008.06.05
申请号 WO2007IB54817 申请日期 2007.11.28
申请人 NXP B.V.;CURATOLA, GILBERTO;AKIL, NADER;SURDEANU, RADU 发明人 CURATOLA, GILBERTO;AKIL, NADER;SURDEANU, RADU
分类号 H01L21/336 主分类号 H01L21/336
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