METHOD OF MANUFACTURING AN INSULATED GATE FIELD EFFECT TRANSISTOR
摘要
<p>A method for fabricating an insulated gate field effect transistor (20) comprising an gate dielectric layer (24) between a gate electrode (23) and a semiconductor substrate (21), wherein the gate electrode (24) is at least partially disposed within a recess (22) formed within the substrate (21), the 5 recess (22) extending between a source region (25) and a drain region (26) of the transistor (20).</p>
申请公布号
WO2008065616(A1)
申请公布日期
2008.06.05
申请号
WO2007IB54817
申请日期
2007.11.28
申请人
NXP B.V.;CURATOLA, GILBERTO;AKIL, NADER;SURDEANU, RADU