| 摘要 |
Noise may cause malfunction and reduction of yield in semiconductor devices operating with a low supply voltage, and a logic test is generally performed for testing characteristics of input/output pads. In the logic test, High Level Input Voltage (VIH), Low Level Input Voltage (VIL), and Input Signal Fault Detection may be considered. In a normal operation mode, the noise propagates through a logic chain by toggling of the test logic circuit, and a circuit can prevent the noise propagation using logical operations. Thus, a characteristic degradation due to the noise propagation may be reduced.
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