发明名称 SYSTEM AND METHOD FOR TESTING LEDS ON A MOTHERBOARD
摘要 An exemplary method for testing light-emitting diodes (LEDs) on a motherboard is provided. The method includes: using a camera module to take a first bulb image of a corresponding number of transparent bulbs which are connected to each of the LEDs when the LEDs are set in a power-on state and taking a second bulb image of the transparent bulbs when the LEDs are set in a power-off state; processing the two bulb images and dividing each of the two bulb images into small pictures; calculating an average pixel value of each of the small pictures, calculating a first difference of each of the small pictures between the average pixel value and a first predetermined value, and calculating a second difference of each of the small pictures between the average pixel value and a second predetermined value; ascertaining a present state of each of the LEDs by comparing the two differences; obtaining test results by comparing the present state of the LEDs with the set state; and reporting the test results. A related system is also provided.
申请公布号 US2008112607(A1) 申请公布日期 2008.05.15
申请号 US20070781966 申请日期 2007.07.24
申请人 HON HAI PRECISION INDUSTRY CO., LTD. 发明人 WU KUAN-LIN;CHEN WEI-YUAN
分类号 G06K9/00 主分类号 G06K9/00
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