发明名称 Measurement apparatus and method
摘要 A measurement apparatus disclosed that has a radiation source configured to provide a measurement beam of radiation such that an individually controllable element of an array of individually controllable elements capable of modulating a beam of radiation, is illuminated by the measurement beam and redirects the measurement beam, and a detector arranged to receive the redirected measurement beam and determine the position at which the redirected measurement beam is incident upon the detector, the position at which the redirected measurement beam is incident upon the detector being indicative of a characteristic of the individually controllable element.
申请公布号 US2008079930(A1) 申请公布日期 2008.04.03
申请号 US20060541793 申请日期 2006.10.03
申请人 ASML NETHERLANDS B.V. 发明人 KLARENBEEK EDUARD MARTINUS
分类号 G01J1/00;G03C5/00 主分类号 G01J1/00
代理机构 代理人
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