发明名称 |
Etching solution for silicon oxide method of manufacturing a semiconductor device using the same |
摘要 |
An etching solution for silicon oxide may be used in a process for enlarging an opening formed through a silicon oxide layer. The etching solution includes about 0.2 to about 5.0 percent by weight of a hydrogen fluoride solution, about 0.05 to about 20.0 percent by weight of an ammonium fluoride solution, about 40.0 to about 70.0 percent by weight of an alkyl hydroxide solution and remaining water. The etching solution may etch the silicon oxide layer without damage to a metal silicide layer exposed by the opening.
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申请公布号 |
US7351667(B2) |
申请公布日期 |
2008.04.01 |
申请号 |
US20060580937 |
申请日期 |
2006.10.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HWANG DONG-WON;YI HUN-JUNG;LIM KWANG-SHIN;PARK JUNG-DAE |
分类号 |
H01L21/469 |
主分类号 |
H01L21/469 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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