发明名称 SYSTEM WITH DUAL LASER FOR SEPARATION OF BONDED WAFERS, EACH LASER EMITTING A LASER BEAM WITH A PREDETERMINED WAVELENGTH
摘要 <p>The present invention relates to a system (100) for dicing a bonded wafer (110) including a plurality of substrates having at least a first substrate (120) bonded to at least a second substrate (130). A first laser (140) is configured to emit a first laser beam (240a) at a first predetermined wavelength such that the first laser beam (240a) creates a modified layer (250) within the first substrate (120) and is transparent to the second substrate (130). A second laser (150) is configured to emit a second laser beam at a second predetermined wavelength such that the second laser beam heats an inner portion of the second substrate (130) creating a stress plane therein and is transparent to the first substrate (120).</p>
申请公布号 WO2008036521(A1) 申请公布日期 2008.03.27
申请号 WO2007US78046 申请日期 2007.09.10
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.;YEO, JONG-SOUK 发明人 YEO, JONG-SOUK
分类号 B23K26/06;B23K26/08;B23K26/40;B23K101/40;C03B33/09;H01L21/304;H01L21/782 主分类号 B23K26/06
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