发明名称 |
SYSTEM WITH DUAL LASER FOR SEPARATION OF BONDED WAFERS, EACH LASER EMITTING A LASER BEAM WITH A PREDETERMINED WAVELENGTH |
摘要 |
<p>The present invention relates to a system (100) for dicing a bonded wafer (110) including a plurality of substrates having at least a first substrate (120) bonded to at least a second substrate (130). A first laser (140) is configured to emit a first laser beam (240a) at a first predetermined wavelength such that the first laser beam (240a) creates a modified layer (250) within the first substrate (120) and is transparent to the second substrate (130). A second laser (150) is configured to emit a second laser beam at a second predetermined wavelength such that the second laser beam heats an inner portion of the second substrate (130) creating a stress plane therein and is transparent to the first substrate (120).</p> |
申请公布号 |
WO2008036521(A1) |
申请公布日期 |
2008.03.27 |
申请号 |
WO2007US78046 |
申请日期 |
2007.09.10 |
申请人 |
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.;YEO, JONG-SOUK |
发明人 |
YEO, JONG-SOUK |
分类号 |
B23K26/06;B23K26/08;B23K26/40;B23K101/40;C03B33/09;H01L21/304;H01L21/782 |
主分类号 |
B23K26/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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