发明名称 SEMICONDUCTOR SUBSTRATE FOR SOLID STATE IMAGING DEVICE, SOLID STATE IMAGING DEVICE, AND METHOD FOR MANUFACTURING THEM
摘要 <p>This invention provides a semiconductor substrate for a solid state imaging device, which, as compared with a gettering method using carbon ion implantation, can realize a lower production cost and can eliminate problems involved in a device process, for example, the occurrence of particles. A solid-solution carbon having a concentration of 1 x 10<SUP>16</SUP> to 1 x 10<SUP>17 </SUP>atoms/cm<SUP>3</SUP> and a solid-solution oxygen having a concentration of 1.4 x 10<SUP>18</SUP> to 1.6 x 10<SUP>18 </SUP>atoms/cm<SUP>3</SUP> are contained in a silicon substrate.</p>
申请公布号 WO2008029918(A1) 申请公布日期 2008.03.13
申请号 WO2007JP67518 申请日期 2007.09.07
申请人 SUMCO CORPORATION;KURITA, KAZUNARI 发明人 KURITA, KAZUNARI
分类号 H01L27/146;H01L21/322;H01L31/10 主分类号 H01L27/146
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