发明名称 |
SEMICONDUCTOR SUBSTRATE FOR SOLID STATE IMAGING DEVICE, SOLID STATE IMAGING DEVICE, AND METHOD FOR MANUFACTURING THEM |
摘要 |
<p>This invention provides a semiconductor substrate for a solid state imaging device, which, as compared with a gettering method using carbon ion implantation, can realize a lower production cost and can eliminate problems involved in a device process, for example, the occurrence of particles. A solid-solution carbon having a concentration of 1 x 10<SUP>16</SUP> to 1 x 10<SUP>17 </SUP>atoms/cm<SUP>3</SUP> and a solid-solution oxygen having a concentration of 1.4 x 10<SUP>18</SUP> to 1.6 x 10<SUP>18 </SUP>atoms/cm<SUP>3</SUP> are contained in a silicon substrate.</p> |
申请公布号 |
WO2008029918(A1) |
申请公布日期 |
2008.03.13 |
申请号 |
WO2007JP67518 |
申请日期 |
2007.09.07 |
申请人 |
SUMCO CORPORATION;KURITA, KAZUNARI |
发明人 |
KURITA, KAZUNARI |
分类号 |
H01L27/146;H01L21/322;H01L31/10 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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