发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE
摘要 <p>A method for fabricating a semiconductor device is provided to prevent an edge of an active region from becoming thinner than a center portion of the active region. A first insulating layer(102a) is formed on a semiconductor substrate(100), and then isolation layers(112a,112b) are formed on the substrate to define an active region covered by the first insulating layer. The isolation layer has a sidewall protruded from the surface of the substrate. The first insulating layer is etched to expose a portion of the active region, while the first insulating layer remains on an edge of the active region. A second insulating layer is formed on the active region to form a tunnel insulating layer. The active region is buried by a conductive layer to form gate patterns(118f,118p) between protruded sidewalls of the isolation layers.</p>
申请公布号 KR20080022774(A) 申请公布日期 2008.03.12
申请号 KR20060086360 申请日期 2006.09.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 EUN, DONG SEOG;CHANG, SUNG NAM
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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