发明名称 |
METHOD OF FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
<p>A method for fabricating a semiconductor device is provided to prevent an edge of an active region from becoming thinner than a center portion of the active region. A first insulating layer(102a) is formed on a semiconductor substrate(100), and then isolation layers(112a,112b) are formed on the substrate to define an active region covered by the first insulating layer. The isolation layer has a sidewall protruded from the surface of the substrate. The first insulating layer is etched to expose a portion of the active region, while the first insulating layer remains on an edge of the active region. A second insulating layer is formed on the active region to form a tunnel insulating layer. The active region is buried by a conductive layer to form gate patterns(118f,118p) between protruded sidewalls of the isolation layers.</p> |
申请公布号 |
KR20080022774(A) |
申请公布日期 |
2008.03.12 |
申请号 |
KR20060086360 |
申请日期 |
2006.09.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
EUN, DONG SEOG;CHANG, SUNG NAM |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|