发明名称 Light source examining method, involves producing laminar light distribution with light source, where image dataset assigned to image of laminar light distribution, comprising pixel laminar photo detector, is produced
摘要 <p>The method involves producing a laminar light distribution with a light source. An image dataset assigned to an image of the laminar light distribution, comprising a pixel laminar photo detector (1), is produced. The photo detector has a laminar structured electrode (2) with multiple sub electrodes (2a). The other electrode (3) is unstructured or structured corresponding to the laminar former electrode and has a photo-active semiconductor layer (5) structured corresponding to the laminar electrode or arranged unstructured between two electrodes. The image dataset or the image is analyzed. An independent claim is also included for a device for examining a light source.</p>
申请公布号 DE102006038580(A1) 申请公布日期 2008.02.21
申请号 DE20061038580 申请日期 2006.08.17
申请人 SIEMENS AG 发明人 FUERST, JENS;HENSELER, DEBORA
分类号 G01J1/42;H01L31/02 主分类号 G01J1/42
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