发明名称 |
METHOD FOR FLATTENING a SOLID SURFACE |
摘要 |
<p>A method for flattening a sample surface by irradiating the sample surface with a gas cluster ion beam, generates clusters of source gas in a cluster generating chamber (11), ionizes the generated clusters in an ionization chamber (13), accelerates the ionized cluster beam in an electric field of an accelerating electrode (15), selects a cluster size using a magnetic field of a sorting mechanism (17), and irradiates the surface of a sample (20). An irradiation angle between the sample surface and the gas cluster ion beam is less than 30° and an average cluster size of the gas cluster ion beam is 50 or above.</p> |
申请公布号 |
EP1890319(A1) |
申请公布日期 |
2008.02.20 |
申请号 |
EP20060756347 |
申请日期 |
2006.05.18 |
申请人 |
JAPAN AVIATION ELECTRONICS INDUSTRY, LIMITED |
发明人 |
SATO, AKINOBU;SUZUKI, AKIKO;BOURELLE, EMMANUEL;MATSUO, JIRO;SEKI, TOSHIO |
分类号 |
H01J37/30;H01L21/302 |
主分类号 |
H01J37/30 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|