发明名称 EDDY CURRENT MEASURING PROBE AND FLAW DETECTION DEVICE USING IT
摘要 PROBLEM TO BE SOLVED: To provide an eddy current measuring probe capable of performing thickness reduction inspection or the like unaccompanied by a supplementary work such as dismantling of a heat insulating material, and evaluating easily a flaw of a pipe or the like, and a flaw detection device using the probe. SOLUTION: The eddy current measuring probe 1 is arranged in the state of keeping a prescribed distance to an electric conductor or a ferromagnetic material which is a measuring object 2, and is equipped with an excitation part 3 for generating an eddy current in the measuring object. The excitation part 3 is constituted of the first excitation coil 5 and the second excitation coil 4 arranged adjacently to the first excitation coil 5, in order to form a magnetic field distribution concentrated into the measuring object 2. The probe 1 may be equipped with a magnetic field detection part 6 disposed adjacently to the excitation part 3. Hereby, flaw detection of a flaw section generated on a ferromagnetic pipe covered with the heat insulating material can be performed accurately and nondestructively in a short time. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008032575(A) 申请公布日期 2008.02.14
申请号 JP20060207271 申请日期 2006.07.29
申请人 NIPPON HIHAKAI KENSA KK 发明人 HASHIMOTO MITSUO
分类号 G01N27/90 主分类号 G01N27/90
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