发明名称 Electron beam processing device and method using carbon nanotube emitter
摘要 Methods and devices for selective etching in a semiconductor process are shown. Chemical species generated in a reaction chamber provide both a selective etching function and concurrently form a protective coating on other regions. An electron beam provides activation to selective chemical species. In one example, reactive species are generated from a plasma source to provide an increased reactive species density. Addition of other gasses to the system can provide functions such as controlling a chemistry in a protective layer during a processing operation. In one example an electron beam array such as a carbon nanotube array is used to selectively expose a surface during a processing operation.
申请公布号 US2008038894(A1) 申请公布日期 2008.02.14
申请号 US20060503690 申请日期 2006.08.14
申请人 MICRON TECHNOLOGY, INC. 发明人 RUEGER NEAL R.;WILLIAMSON MARK J.;SANDHU GURTEJ S.
分类号 H01L21/336 主分类号 H01L21/336
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