发明名称 METHOD OF FABRICATING A PHOTO MASK
摘要 <p>A method for preparing a photomask is provided to omit the additional stripping process for removing a resist layer pattern, thereby reducing the time for manufacturing a photomask. A method for preparing a photomask comprises the steps of forming a light screening layer on a mask substrate; surface treating the light screening layer to relieve the adhesive strength of the light screening layer and a photoresist layer pattern to be formed later; forming a photoresist layer pattern on the light screening layer; and wet etching the light screening layer exposed by the photoresist layer pattern to form a light screening layer and removing the photoresist layer pattern by the etchant used for wet etching.</p>
申请公布号 KR20080012484(A) 申请公布日期 2008.02.12
申请号 KR20060073354 申请日期 2006.08.03
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHIN, JAE CHEON
分类号 G03F1/68;G03F1/80;H01L21/027 主分类号 G03F1/68
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