发明名称 SEMICONDUCTOR PROCESSING METHODS, AND SEMICONDUCTOR CONSTRUCTIONS
摘要 The invention includes methods of forming isolation regions. An opening can be formed to extend into a semiconductor material, and an upper periphery of the opening can be protected with a liner while a lower periphery is unlined. The unlined portion can then be etched to form a widened region of the opening. Subsequently, the opening can be filled with insulative material to form an isolation region. Transistor devices can then be formed on opposing sides of the isolation region, and electrically isolated from one another with the isolation region. The invention also includes semiconductor constructions containing an electrically insulative isolation structure extending into a semiconductor material, with the structure having a bulbous bottom region and a stem region extending upwardly from the bottom region to a surface of the semiconductor material.
申请公布号 KR20080007404(A) 申请公布日期 2008.01.18
申请号 KR20077028552 申请日期 2007.12.06
申请人 MICRON TECHNOLOGY, INC. 发明人 WANG HONGMEI;FUCSKO JANOS;ALLEN TUMAN EARL;LANE RICHARD H.;FISHBURN FRED D.;HANSON ROBERT J.;SHEA KEVIN R.
分类号 H01L21/762 主分类号 H01L21/762
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