发明名称 SEMICONDUCTOR STRUCTURE HAVING LOW HOT-CARRIER EFFECT CHARACTERISTIC
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor structure having a "low hot carrier effect characteristic" that can prolong the life time of an OLED driving IC having a transistor, by decreasing the extent of the "hot carrier effect" when the transistor structure of a semiconductor is in operation. SOLUTION: The semiconductor structure comprises a substrate, a metal layer, an insulation layer, a first semiconductor layer, and a second semiconductor layer. The first semiconductor layer has a first electric resistance value and covers at least parts of the surface of the insulating layer, and the second semiconductor layer has a second electric resistance value and covers at least parts of the surface of the insulating layer. The second electric resistance value of the second semiconductor layer is larger than the first electric resistance value of the first semiconductor layer. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008010802(A) 申请公布日期 2008.01.17
申请号 JP20060236148 申请日期 2006.08.31
申请人 TATUNG CO 发明人 LIN CHIUNG-WEI;LEE CHIEN-FENG;CHEN YI-LIANG
分类号 H01L21/336;H01L21/28;H01L29/786 主分类号 H01L21/336
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