发明名称 Method of manufacturing optical device, and optical device wafer
摘要 <p>A method of manufacturing an optical device includes the steps of: forming a first multilayer film, including forming a first mirror (102) above a substrate (101), forming an active layer (103) above the first mirror (102), forming a second mirror (104) above the active layer (103), forming a semiconductor layer (122) on the second mirror (104), and forming a sacrificial layer on the semiconductor layer (122); conducting a first examination step of conducting a reflectance examination on the first multilayer film; forming a second multilayer film by removing the sacrificial layer from the first multilayer film; conducting a second examination step of conducting a reflectance examination on the second multilayer film; and patterning the second multilayer film to form a surface-emitting laser section (140) having the first mirror (102), the active layer (103) and the second mirror (104), and a diode section (120) having the semiconductor layer (122), wherein the sacrificial layer is formed to have an optical film thickness of an odd multiple of » / 4, where » is a design wavelength of light emitted by the surface-emitting laser section (140).</p>
申请公布号 EP1879273(A2) 申请公布日期 2008.01.16
申请号 EP20070013658 申请日期 2007.07.12
申请人 SEIKO EPSON CORPORATION 发明人 IMAI, YASUTAKA
分类号 H01S5/183;H01S5/026 主分类号 H01S5/183
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