发明名称 Method of making a self-aligned ferroelectric memory transistor
摘要 <p>A method of making a self-aligned ferroelectric memory transistor includes preparing a substrate, shallow trench isolation, n the polysilicon; and forming a gate stack, including: depositing a layer of silicon nitride; selectively etching the silicon nitride, the bottom electrode and the polysilicon; selectively etching the polysilicon to the level of the first dielectric layer; and implanting and activating ions to form a source region and a drain region; forming a sidewall barrier layer; depositing a layer of ferroelectric material; forming a top electrode structure on the ferroelectric material; and finishing the structure, including passivation, oxide depositing and metallization. </p>
申请公布号 EP1302978(A3) 申请公布日期 2008.01.09
申请号 EP20020023155 申请日期 2002.10.15
申请人 SHARP KABUSHIKI KAISHA 发明人 HSU, SHENG TENG;LI, TINGKAI;ZHANG, FENGYAN
分类号 H01L21/28;H01L27/105;H01L21/314;H01L21/316;H01L21/8246;H01L21/8247;H01L29/788;H01L27/115;H01L29/51;H01L29/78;H01L29/792 主分类号 H01L21/28
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