| 摘要 |
A method for fabricating an LCD and a large area substrate for the LCD are provided to facilitate an interim test on a gate driver by providing a test region in a first large area substrate and mounting a test device on the test region. A first large area substrate(130) including a cell region(132) and a test region(142) is prepared. A gate driver(124) and an array element mounted in the cell region, and a test device mounted in the test region are formed. The test device is examined to determined abnormality of the gate driver. As the array substrate, formed as a gate line(112) connected to the gate driver, a data line(114) intersecting the gate line to define a pixel, a liquid crystal capacitor mounted in the pixel, and a thin film transistor including an amorphous silicon semiconductor silicon layer and connecting the data line with the liquid crystal capacitor.
|
