A method for fabricating a capacitor is provided to prevent a lower electrode from collapsing by removing mold oxide layers and a sacrificial oxide layer pattern while using a fluorine-based solvent and by performing a rinse process and a dry process. A mold oxide layer is formed on a semiconductor substrate(1). The mold oxide layer is patterned to form a storage node hole. The sidewall and the bottom of the storage node hole are covered with a lower electrode(17a). The mold oxide layer is eliminated by using a fluorine-based solvent and fluorine-based etchant. A rinse process is performed by using a fluorine-based solvent. A dielectric layer and an upper electrode are formed.
申请公布号
KR20070096255(A)
申请公布日期
2007.10.02
申请号
KR20060025788
申请日期
2006.03.21
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
OH, JUNG MIN;KIM, SANG YONG;HAN, JEONG NAM;HONG, CHANG KI;LEE, KUN TACK