IC SOCKET AND SEMICONDUCTOR INTEGRATED CIRCUIT TESTING DEVICE

摘要

PROBLEM TO BE SOLVED: To increase the number of parallel tests more than hitherto without enlargement of a device or complication of a test program. SOLUTION: This IC socket for mounting detachably a device to be measured on a test board is equipped with a signal generation part for a test for generating a signal for the test based on a control command from a testing device body, and outputting it to the device to be measured. COPYRIGHT: (C)2007,JPO&INPIT