发明名称 GLASS SUBSTRATE INSPECTION EQUIPMENT AND INSPECTION METHOD
摘要 Inspection equipment for a glass substrate being employed in a flat panel display, the glass substrate subjected to cutting at the corner and boring of a through hole, characterized by comprising a stopper provided in the middle of a glass substrate carrier, for stopping the glass substrate at a predetermined position, an image capturing unit consisting of an illuminator on a line being arranged perpendicularly to the carrying direction of the glass substrate and directed from one side of the stopped glass substrate, and a camera provided oppositely to the illuminator across the glass substrate, directed in the direction perpendicular to the carrying direction of the glass substrate and movable in parallel therewith with its optical axis kept perpendicular to the glass substrate, and an image processor for processing the images of the cut at the corner of the glass substrate and the through hole.
申请公布号 KR20070085606(A) 申请公布日期 2007.08.27
申请号 KR20077012375 申请日期 2007.06.01
申请人 CENTRAL GLASS COMPANY, LIMITED 发明人 OKAMURA SHINICHI
分类号 G01N21/958;G01N21/88 主分类号 G01N21/958
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