发明名称 TESTPIECE POSITIONING DEVICE
摘要 PROBLEM TO BE SOLVED: To keep accuracy of testpiece positioning in a positioning device by using an elevation pin having reduced sliding resistance even if the testpiece becomes large in size. SOLUTION: In a testpiece positioning method and a device, the tip of an elevation pin 2 is made like a ball so as to reduce siding resistance. Thus, the positioning device is applicable to a large-sized testpiece, and the accuracy of testpiece positioning can be improved. Furthermore, a position control unit is obliquely arranged and a clamp pin 4 is elevated, thereby avoiding interference caused by contact with an objective lens. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007207807(A) 申请公布日期 2007.08.16
申请号 JP20060021875 申请日期 2006.01.31
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 HIROKAWA SATOSHI;KOSUGE SHOGO;FUKAMACHI TETSUAKI;OTSUKA SHIGENOBU
分类号 H01L21/683 主分类号 H01L21/683
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