发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method which can effectively prevent breakage of a semiconductor wafer, and can favorably perform a semiconductor device manufacturing process. SOLUTION: A circular notch is formed in an manner such that a blade 21 is abutted vertical to one main surface of a semiconductor wafer 11, and the blade 21 is rotated. Then the blade 21 is moved in the circumferential direction of the semiconductor wafer 11. The process for forming the circular notch is carried out several times, whereby, a reinforcement portion 11a having the thickness of semiconductor wafer 11 before grinding is formed on the semiconductor wafer 11. The reinforcement portion 11a functions as a reinforcement member when a semiconductor manufacturing process, such as process for transferring the semiconductor wafer 11, diffusion process, metal film forming process etc. is carried out. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007208145(A) 申请公布日期 2007.08.16
申请号 JP20060027601 申请日期 2006.02.03
申请人 SANKEN ELECTRIC CO LTD 发明人 MITA FUMIAKI
分类号 H01L21/304;B24B1/00 主分类号 H01L21/304
代理机构 代理人
主权项
地址