| 摘要 |
A circuit and a method for built-in self test (BIST) and a computer readable recording medium for storing program thereof are provided. The BIST circuit serves a system to self test a circuit-under-test in the system. The system further includes a unit circuit having a plurality of input terminal couple to a plurality of signal path respectively, and an output terminal couple to the circuit-under-test. A selection and activation circuit of the BIST circuit having an output terminal couple to one of input terminals of the unit circuit, one input terminal couple to a non-timing-critical path of the signal paths, and the other input terminal receives a test signal. When the system operates in a test mode, the BIST controller provides the test signal through the selection and activation circuit and the unit circuit to test the circuit-under-test.
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