发明名称 APPARATUS AND METHOD FOR INSPECTION
摘要 PROBLEM TO BE SOLVED: To improve inspection efficiency by executing continuity inspection and insulation inspection in parallel with one type of signals for inspection supplied for objects to be inspected. SOLUTION: An inspection apparatus is provided with both a power supply part 2 for supplying a conductor pattern 101 with signals St for inspection acquired by adding A.C. signals and D.C. signals together and an arithmetic control part 7 for executing continuity inspection on the conductor pattern 101 on the basis of a value of an A.C. current Ia flowing through the conductor pattern 101 due to the supply of A.C. signals within the signals St for inspection and executing insulation inspection on the conductor pattern 101 on the basis of a value of a D.C. current Id flowing through the conductor pattern 101 due to the supply of D.C. signals within the signals St for inspection. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007198758(A) 申请公布日期 2007.08.09
申请号 JP20060014497 申请日期 2006.01.24
申请人 HIOKI EE CORP 发明人 KOIKE SHINICHI
分类号 G01R31/02;H05K3/00 主分类号 G01R31/02
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