| 摘要 |
1,224,233. X-ray fluorescence analysis. OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES. May 3, 1968 [May 5, 1967; April 5, 1968], No.21103/68. Heading G1A. A material is investigated by electron induced X-ray fluorescence whilst being subjected to heattreatment by the electron beam. A surface 54, Fig. 17, under treatment is irradiated by an electron gun 75 and fluorescent X-rays are detected by spectrometers 70, 70<SP>1</SP> sensitive to the L rays of different constituents of the material and aligned with the same point on the surface. The gun is first controlled by function generators 77, 78 to scan in x and y directions in turn to determine the co-ordinates of the point at which spectrometers 70, 70<SP>1</SP> respond. These co-ordinates are then stored at 84 and 85. The gun is then controlled by the function generator 76 so that the beam moves along a locus to effect the required heat-treatment. For a short period each cycle, the gun is controlled by the generator 79 which deflects the beam to the point at which the spectrometers 70, 70<SP>1</SP> respond so that the quotient of their signals may be indicated and recorded or used to control the addition of one of the constituents to the sample of material being treated. The spectrometers 70, 70<SP>1</SP> may be moved by motors 93 under control of a programmer 95. |
