发明名称 In-furnace temperature measuring method
摘要 There is provided an in-furnace temperature measuring method that is capable of reducing the number of operation steps that are required for temperature measurement, and effectively applying a measurement result even if colors and finishing states of a circuit board and an electronic part are changed. First and second pseudo circuit boards ( 12 ) and ( 13 ) having the substantially same configuration and dimensions as those of a circuit board are inserted into a reflow furnace ( 11 ), the front and rear surface temperatures of the first and second pseudo circuit boards ( 12 ) and ( 13 ) and air temperatures around the first and second pseudo circuit boards ( 12 ) and ( 13 ) within the reflow furnace ( 11 ) are measured. The entire surface of a metal whose physical value is known is black-coated in the first pseudo circuit board ( 12 ), and the entire surface of a metal whose given physical value is known is mirror-finished in the second pseudo circuit board ( 13 ).
申请公布号 US2007144626(A1) 申请公布日期 2007.06.28
申请号 US20060387868 申请日期 2006.03.24
申请人 FUJITSU LIMITED 发明人 FUKUDA TAKASHI
分类号 C21D11/00 主分类号 C21D11/00
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