发明名称 Process to form an isolated trench image in photoresist
摘要 An isolated hole in a photoresist layer is formed by surrounding it with additional, somewhat narrower, dummy hole features. The ratio of feature width to resist thickness is adjusted so that, after development, there is no resist on the floor of the isolated (main) hole whereas a reduced, but finite, thickness of resist remains on the floors of the holes derived from the dummy features. The isolated hole may then be used for etching or electroplating the underlying substrate.
申请公布号 US2007134597(A1) 申请公布日期 2007.06.14
申请号 US20050297093 申请日期 2005.12.08
申请人 HEADWAY TECHNOLOGIES, INC. 发明人 LAUCHLAN LAURIE J.
分类号 G03F7/26 主分类号 G03F7/26
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