发明名称 EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD
摘要 Provided is an exposure apparatus that is able to prevent liquid from remaining on a measuring part. An exposure apparatus comprises a measuring system (60), which has a first pattern (61) formed on the upper surface of a substrate stage, and a second area (S2) specified on the upper surface in the vicinity of a first area (S1), which includes the first pattern (61), and a second pattern (80) is formed in the second area (S2) so that the liquid (LQ) that has remained so as to span the first area (S1) and the second area (S2) retreats from the first area (S1) and collects in the second area (S2).
申请公布号 KR20070048164(A) 申请公布日期 2007.05.08
申请号 KR20077000944 申请日期 2007.01.15
申请人 NIKON CORPORATION 发明人 NAKANO KATSUSHI;HAGIWARA TSUNEYUKI
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
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