| 摘要 |
Disclosed is a method of forming a dual damascene pattern. The method can include forming a first etch stop layer, a first dielectric layer, a second etch stop layer, a second dielectric layer and a cap insulating layer on a substrate, forming a preliminary via hole exposing a part of the first etch stop layer by patterning the insulating layer structure, and forming a sacrificial layer pattern in the preliminary via hole. After forming a mask pattern on the cap insulating layer, a trench is formed by patterning the cap insulating layer, the second dielectric layer and a part of the sacrificial layer. The sacrificial layer pattern and the mask pattern are removed in-situ through an ashing process, thereby forming a via hole.
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