发明名称 Method for sensing wafers located inside a closed wafer cassette
摘要 Wafers in a cassette are mapped without having to open the cassette. The cassette is at least partially transparent to a particular type of radiation. A source of the radiation is directed into the cassette, through a transparent or translucent part of the cassette, and an imaging sensor sensitive to the radiation detects radiation that is reflected off the wafers inside the cassette. A second source of radiation and a second camera preferably provide additional images of the wafers from a different angle. By processing these images, the spatial orientation of the wafers and loading status of the cassette can be determined.
申请公布号 US7202491(B2) 申请公布日期 2007.04.10
申请号 US20060343476 申请日期 2006.01.30
申请人 ASM INTERNATIONAL N.V. 发明人 GARSSEN ADRIAAN;VAN GROEN JOOST;MARIA DE RIDDER CHRISTIANUS GERARDUS
分类号 G01N21/86;H01L21/67;G01B11/02;G01N21/88;G01V8/10 主分类号 G01N21/86
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