发明名称 Lithographic apparatus and device manufacturing method
摘要 A lithographic apparatus and device manufacturing method is provided in which exposure is carried out by projecting through a liquid having a pH of less than 7, the liquid being in contact with a substrate to be exposed. The liquid advantageously comprises an anti-reflective topcoat.
申请公布号 US2007046915(A1) 申请公布日期 2007.03.01
申请号 US20060355192 申请日期 2006.02.16
申请人 ASML NETHERLANDS B.V. 发明人 STREEFKERK BOB;DIERICHS MARCEL MATHIJS T.M.;GEHOEL-VAN ANSEM WENDY F.J.
分类号 G03B27/42;G03F7/20;H01L21/027 主分类号 G03B27/42
代理机构 代理人
主权项
地址
您可能感兴趣的专利