发明名称 Method and system of generic implementation of sharing test pins with I/O cells
摘要 The present invention provides a method and a system of generic implementation of sharing test pins with I/O cells. The method includes a step of making a general change in a testlib file. The testlib file is suitable for controlling I/O cell pins to gain test access. The general change restricts I/O cells for sharing with test pins. The method further includes a step of making iogen changes for sharing. Optionally, the method may include a step of making a cell level change in the testlib file. The cell level change overrides restrictions defined by the general change.
申请公布号 US7181359(B2) 申请公布日期 2007.02.20
申请号 US20040988081 申请日期 2004.11.12
申请人 LSI LOGIC CORPORATION 发明人 GOYAL SAKET K.
分类号 G01R27/28 主分类号 G01R27/28
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