发明名称 RETICLE FOR MEASURING POLARIZATION
摘要 <p>A reticle for measuring polarization is provided to measure directly the amount of polarization supplied from exposure equipment by checking energy when a sensitive emulsion is removed in an exposure process using a predetermined pattern. A reticle for measuring polarization includes scribe lane. Line/space polarization patterns(100,110) are formed on the scribe lane. The line/space polarization patterns are formed in horizontal and vertical directions. A predetermined pattern with a predetermined angle range of 1 to 90 degree is formed between the horizontally and vertically arranged patterns.</p>
申请公布号 KR20070002689(A) 申请公布日期 2007.01.05
申请号 KR20050058324 申请日期 2005.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, HYEONG SOO
分类号 H01L21/027 主分类号 H01L21/027
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