发明名称 PROCESSING SYSTEM AND PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a processing system and a processing method for effectively removing particles from a wafer, before being carried into a carrier or a wafer carried out of the carrier. SOLUTION: The processing system for processing a substrate W comprises a processing section for processing the substrate W; a mount table 40 for mounting a storage vessel C for storing a plurality of substrates W; and a substrate carrier 60 for carrying the substrates W into or out of the storage vessel C via an opening 20 in the storage vessel C, while holding the substrates W in a nearly horizontal attitude. Then, a gas supply port 73 for supplying gas to the substrates W held by the substrate carrier 60 in a direction of going from the side of the opening 20 to the outside of the opening 20. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006351864(A) 申请公布日期 2006.12.28
申请号 JP20050176648 申请日期 2005.06.16
申请人 TOKYO ELECTRON LTD 发明人 MORI KOHEI
分类号 H01L21/677;B08B5/00;H01L21/304 主分类号 H01L21/677
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