| 摘要 |
A test apparatus comprising a test module for supplying to an electronic device; a master signal supplying part for generating, in accordance with the phase of a timing signal supplied thereto, and supplying a first timing signal to the test module; and a slave signal supplying part for receiving the timing signal from the master signal supplying part to generate a second timing signal for controlling the timing at which the test module supplies a test pattern to the electronic device and for supplying the second timing signal to the test module; wherein the slave signal supplying part has a phase adjusting circuit for delaying the timing signal received from the master signal supplying part such that the timing at which the master signal supplying part outputs the first timing signal is approximately the same as the timing at which the slave signal supplying part outputs the second timing signal.
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